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Phys. Rev. B 50, 7439–7442 (1994)

Identification of the migration path of interstitial carbon in silicon

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R. B. Capaz
Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

A. Dal Pino, Jr.
Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
Instituto Tecnológico da Aeronáutica, São José dos Campos, São Paulo 12228, Brazil

J. D. Joannopoulos
Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

Received 5 May 1994; published in the issue dated 15 September 1994

We have performed ab initio total-energy calculations of ground-state properties and migration paths of interstitial carbon in silicon. The ground state involves threefold-coordinated carbon and silicon atoms and its geometry suggests primarily p and sp bonding for carbon, rather than sp2 one would naively expect. Examination of possible migration paths reveals that only three correspond to small ‘‘jumps’’ involving a single ‘‘bond breaking.’’ Of these, we predict that only one has a barrier of considerably lower energy (∼0.5 eV) and involves an intermediate ‘‘saddle-point’’ configuration of C2 symmetry.

© 1994 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.50.7439
DOI:
10.1103/PhysRevB.50.7439
PACS:
71.55.-i, 61.72.Ji, 66.30.Jt