Phys. Rev. B 37, 9738–9741 (1988)Tunneling measurements of the dependence of the energy gap on critical temperature in La2-xSrxCuO4-yReceived 25 February 1988; published in the issue dated 1 June 1988 We have used a low-temperature, in situ cleaving, scanning tunneling microscope to measure the energy gap in a series of La2-xSrxCuO4-y samples with different Sr doping concentrations x, and therefore different critical temperatures. The current-voltage characteristics vary from measurement to measurement, but consistent results can be obtained by selecting "high-quality" data. We discuss the criteria used for this selection. We find that the measured gaps scale with critical temperature with the ratio 2Δ/kBTc∼5. © 1988 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevB.37.9738
DOI:
10.1103/PhysRevB.37.9738
PACS:
|
|
About | Terms and Conditions | Subscriptions | Search | Help
Use of the American Physical Society websites and journals implies that the user has read and agrees to our Terms and Conditions and any applicable Subscription Agreement. Physical Review®, Physical Review Letters®, Reviews of Modern Physics®, and Physical Review Special Topics® are trademarks of the American Physical Society.