Phys. Rev. B 36, 2433–2435 (1987)Antiparallel coupling between Fe layers separated by a Cr interlayer: Dependence of the magnetization on the film thickness
Spin-polarized low-energy electron diffraction is applied for the first time to study the coupling between ferromagnetic and antiferromagnetic ultrathin films. The remanent magnetization for the epitaxial double-layer structure Feii/Cr/Fei/Cr(100) has been monitored in situ during growth. The two Fe slabs (Feii, Fei) separated by a thin Cr layer show in-plane antiparallel magnetic coupling along the external magnetic field direction when the two Fe-layer thicknesses differ. The measurements suggest a 90° rotation of the antiparallel magnetization for equal Fe-layer thicknesses. © 1987 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevB.36.2433
DOI:
10.1103/PhysRevB.36.2433
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