Phys. Rev. B 35, 6792–6795 (1987)Interface roughening and domain growth in the dilute Ising modelReceived 28 August 1986; published in the issue dated 1 May 1987 We have studied domain growth in the two-dimensional dilute Ising model following an instantaneous quench from a very high temperature to a temperature below the critical point. We have carried out Monte Carlo simulations of system sizes up to 6002 out to a maximum of 20 000 Monte Carlo steps per spin. We have interpreted the crossover from the curvature-driven regime to a new growth regime in the light of a phenomenological theory that describes the impurity roughening of the interface between the two phases. © 1987 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevB.35.6792
DOI:
10.1103/PhysRevB.35.6792
PACS:
75.10.Hk, 05.50.+q, 75.70.Kw, 75.60.Ch
|
|
About | Terms and Conditions | Subscriptions | Search | Help
Use of the American Physical Society websites and journals implies that the user has read and agrees to our Terms and Conditions and any applicable Subscription Agreement. Physical Review®, Physical Review Letters®, Reviews of Modern Physics®, and Physical Review Special Topics® are trademarks of the American Physical Society.