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Phys. Rev. B 31, 3593–3598 (1985)

Scanning tunneling microscope as a structure-modifying tool

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H. H. Farrell
Bell Communications Research, Murray Hill, New Jersey 07974

M. Levinson
AT&T Bell Laboratories, Murray Hill, New Jersey 07974

Received 13 December 1984; published in the issue dated 15 March 1985

We explore the possibility that surface charge induced by the scanning tunneling microscope will influence the structure of the surface under investigation. In general, we find that the emission currents limit the induced charge densities and preclude major structural modifications on the more stable surfaces. However, the possibility of modifying less stable structures or of reducing the transition temperatures for transformation between different surface phases does exist and is discussed in detail.

© 1985 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.31.3593
DOI:
10.1103/PhysRevB.31.3593
PACS:
79.70.+q, 73.20.-r