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Phys. Rev. B 31, 2410–2415 (1985)

Electronic and transport properties of hydrogenated amorphous silicon

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A. D. Zdetsis, E. N. Economou, D. A. Papaconstantopoulos, and and N. Flytzanis
Research Center of Crete and Department of Physics, University of Crete, Heraklio, Crete, Greece

Received 11 June 1984; published in the issue dated 15 February 1985

We have extended previous coherent-potential-approximation calculations of the electronic and transport properties of hydrogenated amorphous silicon (a-Si), in order to examine the effects of fully dispersed hydrogen in a-Si. The present calculation replaces random vacancies in the Si matrix by single H atoms instead of the four-H-atom clusters previously considered. In addition, to eliminate dangling-bond states in the gap we have introduced an ad hoc reconstruction of the lattice around the vacancy by effectively saturating the dangling orbitals with other Si atoms. Our results reinforce previous claims that an understanding of various experiments in a-Si:H can be obtained from first-principles calculations which neglect topological disorder and the precise configuration of the hydrogen atoms. The present calculations lead to an improved agreement with the photoemission and optical absorption data.

© 1985 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.31.2410
DOI:
10.1103/PhysRevB.31.2410
PACS:
71.25.Mg, 72.80.Ng, 78.50.Ge, 72.10.Bg