corner
corner

Phys. Rev. B 30, 7349–7351 (1984)

Ballistic electrons in an inhomogeneous submicron structure: Thermal and contact effects

Download: PDF (241 kB) Buy this article Export: BibTeX or EndNote (RIS)

Harold U. Baranger and John W. Wilkins
Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, New York 14853

Received 1 October 1984; published in the issue dated 15 December 1984

For a simple submicron semiconductor structure we have calculated exactly the electron distribution f(v,x) within a relaxation-to-local-equilibrium assumption for the collision term of the Boltzmann equation. This is the first calculation of the electron distribution in an inhomogeneous semiconductor. Large applied voltages produce a substantial ballistic peak in f(v,x). But at all voltages contact inhomogeneities and local heating (and cooling) produce an I-V characteristic only weakly dependent on the scattering rate.

© 1984 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.30.7349
DOI:
10.1103/PhysRevB.30.7349
PACS: