Phys. Rev. B 18, 416–420 (1978)Critical behavior of random resistor networks near the percolation thresholdReceived 23 December 1977; published in the issue dated 1 July 1978 We use low-density series expansions to calculate critical exponents for the behavior of random resistor networks near the percolation threshold as a function of the spatial dimension d. By using scaling relations, we obtain values of the conductivity exponent μ. For d=2 we find μ=1.43±0.02, and for d=3, μ=1.95±0.03, in excellent agreement with the experimental result of Abeles et al. Our results for high dimensionality agree well with the results of ε-expansion calculations. © 1978 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevB.18.416
DOI:
10.1103/PhysRevB.18.416
PACS:
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